Competitive 1T-DRAM in 28 nm FDSOI Technology for Low-Power Embedded Memory

Title
Competitive 1T-DRAM in 28 nm FDSOI Technology for Low-Power Embedded Memory
Authors
김용태H. El DiraniM. BawedinK. LeeM. PariharX. MescotP. FonteneauPh. GalyF. GamizP. FerrariS. Cristoloveanu
Issue Date
2016-10
Publisher
Proceedings of the IEEE
Citation
VOL 4, NO 1-979
URI
http://pubs.kist.re.kr/handle/201004/64845
ISSN
0018-9219
Appears in Collections:
KIST Publication > Article
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