A new method for mapping the three-dimensional atomic distribution within nanoparticles by atom probe tomography (APT)

Title
A new method for mapping the three-dimensional atomic distribution within nanoparticles by atom probe tomography (APT)
Authors
안재평이지영김세호강필웅박오옥설재복최벽파
Issue Date
2018-07
Publisher
Ultramicroscopy
Citation
VOL 190-38
Abstract
We present a new method of preparing needle-shaped specimens for atom probe tomography from freestanding Pd and C-supported Pt nanoparticles. The method consists of two steps, namely electrophoresis of nanoparticles on a flat Cu substrate followed by electrodeposition of a Ni film acting as an embedding matrix for the nanoparticles. Atom probe specimen preparation can be subsequently carried out by means of focused-ion-beam milling. Using this approach, we have been able to perform correlative atom probe tomography and transmission electron microscopy analyses on both nanoparticle systems. Reliable mass spectra and three-dimensional atom maps could be obtained for Pd nanoparticle specimens. In contrast, atom probe samples prepared from C-supported Pt nanoparticles showed uneven field evaporation and hence artifacts in the reconstructed atom maps. Our developed method is a viable means of mapping the three-dimensional atomic distribution within nanoparticles and is expected to contribute to an improved understanding of the structure-composition-property relationships of various nanoparticle systems.
URI
http://pubs.kist.re.kr/handle/201004/67533
ISSN
0304-3991
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KIST Publication > Article
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