A Simple Method for Estimation of Silicon Film Thickness in Tri-Gate Junctionless Transistors

Title
A Simple Method for Estimation of Silicon Film Thickness in Tri-Gate Junctionless Transistors
Authors
전대영So Jeong ParkMireille MouisSylvain BarraudGyu-Tae KimGerard Ghibaudo
Keywords
Junctionless transistors (JLTs); numerical simulation; Si thickness (tsi); bulk neutral channel; surface accumulation channel; method for parameter extraction
Issue Date
2018-09
Publisher
IEEE Electron Device Letters
Citation
VOL 39, NO 9-1285
URI
http://pubs.kist.re.kr/handle/201004/68031
ISSN
0741-3106
Appears in Collections:
KIST Publication > Article
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