Electron transport phenomena at the interface of Al electrode and heavily doped degenerate ZnO nanoparticles in quantum dot light emitting diode

Title
Electron transport phenomena at the interface of Al electrode and heavily doped degenerate ZnO nanoparticles in quantum dot light emitting diode
Authors
최원국이연주김정혁김홍희이윤재최헌진
Keywords
ZnO nanoparticles; electron transport layer; Quantum dots; LIght-emitting diodes; degenerate semiconductor; oxygen vacancy
Issue Date
2019-01
Publisher
Nanotechnology
Citation
VOL 30, NO 3-035207-9
Abstract
ZnO nanoparticles (NPs) of 4– 5 nm, widely adopted as an electron transport layer (ETL) in quantum dot light emitting diodes (QD-LEDs), were synthesized using the solution-precipitation process. It is notable that synthesized ZnO NPs are highly degenerate intrinsic semiconductors and their donor concentration can be increased up to N D = 6.9 × 1021 cm– 3 by annealing at 140 °C in air. An optical bandgap increase of as large as 0.16– 0.33 eV by degeneracy is explained well by the Burstein– Moss shift. In order to investigate the influence of intrinsic defects of ZnO NP ETLs on the performance of QD-LED devices without a combined annealing temperature between ZnO NP ETLs and the emissive QD layer, pre-annealed ZnO NPs at 60 °C, 90 °C, 140 °C, and 180 °C were spin-coated on the annealed QD layer without further post-annealing. As the annealing temperature increases from 60 °C to 180 °C, the defect density related to oxygen vacancy (V O) in ZnO NPs is reduced from 34.4% to 17.8%, whereas the defect density of interstitial Zn (Zni) is increased. Increased Zni reduces the width (W) of the depletion region from 0.21 to 0.12 nm and lowers the Schottky barrier (ФB) between ZnO NPs and the Al electrode from 1.19 to 0.98 eV. We reveal for the first time that carrier conduction between ZnO NP ETLs and the Al electrode is largely affected by the concentration of Zni above the conduction band minimum, and effectively described by space charge limited current and trap charge limited current models.
URI
http://pubs.kist.re.kr/handle/201004/68679
ISSN
0957-4484
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KIST Publication > Article
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