Residual modulation reduction in optical sectioning using a suitable SLM waveform

Title
Residual modulation reduction in optical sectioning using a suitable SLM waveform
Authors
박민철유낙원한정헌김명하주병권
Issue Date
2019-08
Publisher
Applied optics
Citation
VOL 58, NO 22-5891
Abstract
We propose a method to improve the axial response of structured illumination microscopy via selection of an illumination pattern with a sinusoidal or square wave within the cutoff frequency of the imaging system. Residual modulation within a sectioned image is mitigated by accurate phase-shifting via the electrical spatial light modulator control signal, which is based on an illumination pattern having a suitable waveform. Reduction in residual modulation is observed in the sinusoidal pattern with a spatial frequency sufficiently below the cutoff frequency of the imaging system. This reduction is larger for the square wave as the spatial frequency approaches one-third of the cutoff frequency.
URI
http://pubs.kist.re.kr/handle/201004/70478
ISSN
1559-128X
Appears in Collections:
KIST Publication > Article
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