Residual modulation reduction in optical sectioning using a suitable SLM waveform
- Residual modulation reduction in optical sectioning using a suitable SLM waveform
- 박민철; 유낙원; 한정헌; 김명하; 주병권
- Issue Date
- Applied optics
- VOL 58, NO 22-5891
- We propose a method to improve the axial response of structured illumination microscopy via selection of an illumination pattern with a sinusoidal or square wave within the cutoff frequency of the imaging system. Residual modulation within a sectioned image is mitigated by accurate phase-shifting via the electrical spatial light modulator control signal, which is based on an illumination pattern having a suitable waveform. Reduction in residual modulation is observed in the sinusoidal pattern with a spatial frequency sufficiently below the cutoff frequency of the imaging system. This reduction is larger for the square wave as the spatial frequency approaches one-third of the cutoff frequency.
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