Channel thickness-dependent mobility degradation in planar junctionless

Title
Channel thickness-dependent mobility degradation in planar junctionless
Authors
전대영
Keywords
junctionless transistors; bulk conduction; threshold voltage; maximum depletion width; mobility degradation
Issue Date
2020-01
Publisher
Japanese Journal of Applied Physics, Part 1- Regular Papers
Citation
VOL 59, NO 014001-014001-4
URI
http://pubs.kist.re.kr/handle/201004/70829
ISSN
0021-4922
Appears in Collections:
KIST Publication > Article
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