Nanodomain Analysis with Cluster-SIMS: Application to the Characterization of Macromolecular Brush Architecture

Title
Nanodomain Analysis with Cluster-SIMS: Application to the Characterization of Macromolecular Brush Architecture
Authors
조상호Fan YangGuorong SunStanislav V. VerkhoturovJames W. ThackerayPeter TrefonasKaren L. WooleyEmile A. Schweikert
Issue Date
2015-11
Publisher
Surface and interface analysis : SIA
Citation
VOL 47, NO 11-1055
Abstract
We present the application of cluster-SIMS for the analysis of the nanoscopic surface of diblock brush terpolymers (DBTs). This novel SIMS technique differs from conventional SIMS. It uses Au-400(4+) projectiles at 520keV and an event-by-event bombardment/detection regime for the analysis of co-localized molecular species. The performance of this SIMS method was tested on bottle brush' block molecules featuring a vertical aligned backbone structure. We were able to assess the extent of secondary ion emissions from the surface and analyze the degree of ordered alignment for DBTs by the fluorocarbon surface coverage. We demonstrate the feasibility of characterizing the homogeneity of macromolecular films at the nanoscale.
URI
http://pubs.kist.re.kr/handle/201004/71174
ISSN
0142-2421
Appears in Collections:
KIST Publication > Article
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