Structural and Electronic Properties of Flexible ZnO and Ti/Mn:ZnO Thin Films

Title
Structural and Electronic Properties of Flexible ZnO and Ti/Mn:ZnO Thin Films
Authors
채근화Manish KumarJitendra Pal SinghHyun Hwi Lee
Keywords
Zinc oxide; Flexible substrate; Flexible electronics; X-ray diffraction; X-ray absorption spectroscopy
Issue Date
2020-09
Publisher
Journal of the Korean Physical Society
Citation
VOL 77, NO 5-456
Abstract
Thin films of ZnO, Ti doped ZnO and Mn doped ZnO were prepared on flexible polyimide substrates by means of the RF sputtering technique for different sputtering parameters, and their structural and electronic properties were investigated. Grazing incidence X-ray diffraction (GIXRD) results confirmed that the grown samples followed the hexagonal wurtzite symmetry. The lattice parameters and the crystallite size showed a dependence on doping as well as deposition condition. The presence of oxygen during sputtering growth significantly suppressed the crystallite size and increased the number of oxygen defect states. The effect of doping and the deposition parameters on the electronic structure of flexible ZnO thin films was also realized through X-ray absorption measurements.
URI
http://pubs.kist.re.kr/handle/201004/72236
ISSN
0374-4884
Appears in Collections:
KIST Publication > Article
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML


qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE