Thickness effects of SiOxNy interlayer inserted between BaTiO3 insulating layer and ZnS:Mn phosphor layer in thin film electroluminescent devices

Title
Thickness effects of SiOxNy interlayer inserted between BaTiO3 insulating layer and ZnS:Mn phosphor layer in thin film electroluminescent devices
Authors
송만호이윤희오명환한택상K. H. Yoon
Issue Date
1996-01
Publisher
Journal of crystal growth
Citation
VOL 167, 157-164
URI
http://pubs.kist.re.kr/handle/201004/7640
ISSN
0022-0248
Appears in Collections:
KIST Publication > Article
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