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랩온어칩에서의 형광 편광 측정 방법

Author

양은경; 김정환; 김태송; 조한상; 강지윤; 신현준; 주병권

Assignee

한국과학기술연구원

Regitration Date

2008-09-23

Registration No.

7,427,509

Application Date

2006-06-05

Application No.

11/422,142

Country

US

URI

https://pubs.kist.re.kr/handle/201004/78163

Appears in Collections:

KIST Patent > Others

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