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dc.contributor.authorJeong Young Kon-
dc.contributor.authorSoo Jong Park-
dc.contributor.authorLee, Sang-Hun-
dc.contributor.authorByeong-Kwon Ju-
dc.contributor.authorJhon, Young Min-
dc.contributor.authorMINAH SEO-
dc.date.accessioned2024-01-12T06:11:33Z-
dc.date.available2024-01-12T06:11:33Z-
dc.date.created2021-09-29-
dc.date.issued2018-07-
dc.identifier.issn2166-8884-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/79405-
dc.description.abstractWe investigated degradation of organic light emitting diodes (OLED) by terahertz (THz) time-domain spectroscopy. Decreased reflectance at 0.84 THz was observed inferred from the electric degradation of OLED.-
dc.languageEnglish-
dc.publisherOSK-
dc.subjectTeraheryz spectroscopy-
dc.subjectOrganic light emitting diodes-
dc.subjectDegradation-
dc.titleCharacterization of Degradation in Organic Light Emitting Diodes by Terahertz Spectroscopy-
dc.title.alternative테라헤르츠 분광학에 의한 유기발광 다이오드의 열화 특성 분석-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitationOECC 2018 The 23rd optoElectronics and Communications Conference-
dc.citation.titleOECC 2018 The 23rd optoElectronics and Communications Conference-
dc.citation.conferencePlaceKO-
dc.citation.conferencePlace제주-
dc.citation.conferenceDate2018-07-02-
dc.relation.isPartOf23RD OPTO-ELECTRONICS AND COMMUNICATIONS CONFERENCE (OECC2018)-
dc.identifier.wosid000477695500255-
dc.identifier.scopusid2-s2.0-85068003842-
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