KIST Library Institutional Repository

X-ray scattering and X-ray reflectivity investigation on RF-sputtering grown ZnFe2O4 thin films

Authors

Lee Byeong-hyeon; Kim Sunmin; CHAE, KEUN HWA; Won, Sung Ok

Issue Date

2018-02

Publisher

한국진공학회

Citation

한국진공학회 동계정기학술대회

Keywords

X-ray reflectivity; RF-sputtering; X-ray diffraction; Zn-ferrite

URI

https://pubs.kist.re.kr/handle/201004/79448

Appears in Collections:

KIST Conference Paper > 2018

Files in This Item:

There are no files associated with this item.

Export

RIS (EndNote)

XLS (Excel)

XML