Perfect capacity retention of all-vanadium redox flow battery using Nafion/polyaniline composite membranes

Authors
Sheeraz, MehboobLEE, JU YOUNGAhn, ji hun살림 아바스Huy, Do XuanKim, Jaewon신현진헨켄스마이어디억Ha, Heung Yong
Issue Date
2023-05
Publisher
한국공업화학회
Citation
Journal of Industrial and Engineering Chemistry, v.121, no.25, pp.348 - 357
Abstract
Crossover of vanadium ions through proton conducting membranes in all-vanadium redox flow batteries (VRFBs) causes considerable engineering problems and deteriorates VRFB performance by reducing capacity retention over cycles. In this study, we have succeeded in fabrication of multi-layered polyaniline/Nafion (PANI-Nafion) composite membranes that exhibit a very low vanadium ion permeability and, therefore, can significantly improve VRFB performance by preserving electric capacity almost perfectly. The multi-layered PANI-Nafion membrane is fabricated by sequentially coating a PANI layer followed by Nafion layer on Nafion 115 membrane using a dip-coating method. The fabricated membrane outperforms pristine Nafion 115 membrane in terms of VRFB performance by exhibiting a very high coulombic efficiency of ∼ 99 % and an energy efficiency of ∼ 91 % at 50 mA cm?2. Particularly, it shows a remarkable improvement in durability and capacity retention with a 100 % discharge capacity retention over 100 cycles of charge/discharge operation as compared with that of pristine N115 (63 %). In-depth analyses have been conducted to characterize the PANI-Nafion composite membrane and to understand the mechanism of how it enhances the performance of VRFB. This study has shown a possibility to make VRFBs having a perfect capacity retention using PANI-coated composite membranes, which may help expedite full-fledged commercialization of VRFBs.
Keywords
NAFION MEMBRANES; PROTON CONDUCTIVITY; LAYER; SELECTIVITY; ELECTRODES; EFFICIENCY; STABILITY; FILMS; CELL; Membrane; Polyaniline; Protonation; Vanadium redox flow battery; Voltage drop
ISSN
1226-086X
URI
https://pubs.kist.re.kr/handle/201004/79943
DOI
10.1016/j.jiec.2023.01.038
Appears in Collections:
KIST Article > 2023
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