Interfacial defects in SiO₂-glass bond during VCR head fabrication

Title
Interfacial defects in SiO₂-glass bond during VCR head fabrication
Authors
윤능구황재웅고경현안재환제해준홍국선
Keywords
VCR 헤드; VCR head; SiO₂ 박막; SiO₂ thin film; 계면 결함; inteface defect
Issue Date
1994-01
Publisher
한국재료학회지; Korean journal of materials research
Citation
VOL 4, NO 1, 31-36
URI
http://pubs.kist.re.kr/handle/201004/8058
Appears in Collections:
KIST Publication > Article
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