반도체 패키지의 삼차원 시각 검사방법 및 장치

Author
유범재오상록이두현권인소
Assignee
한국과학기술연구원
Regitration Date
2003-03-25
Registration No.
378988
Application Date
2000-10-27
Application No.
00-63402
Country
KO
URI
https://pubs.kist.re.kr/handle/201004/81756
Appears in Collections:
KIST Patent > 2000
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