고분해능 투과전자현미경을 이용한 (001) CdTe/(001) GaAs 박막의 결함 .

Title
고분해능 투과전자현미경을 이용한 (001) CdTe/(001) GaAs 박막의 결함 .
Authors
서상희권명석이정용송원준
Keywords
TEM; (100)CdTe/(100)GaAs; 결함
Issue Date
1994-01
Publisher
응용물리
Citation
v. 7, 266-266
URI
http://pubs.kist.re.kr/handle/201004/8192
Appears in Collections:
KIST Publication > Article
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