Performance characteristics of the PMS SAS-3600 wafer surface scanner.

Title
Performance characteristics of the PMS SAS-3600 wafer surface scanner.
Authors
채승기Benjamin Y. H. Liu배귀남명현국이춘식
Keywords
wafer surface scanner; light scattering; microcontamination; particles; silicon wafers
Issue Date
1993-01
Publisher
Proceedings of the 39th annual technical meeting of the IES.
Citation
v. 1, 336-344
URI
http://pubs.kist.re.kr/handle/201004/8257
Appears in Collections:
KIST Publication > Conference Paper
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