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dc.contributor.author김은규-
dc.contributor.author김현수-
dc.contributor.author민석기-
dc.date.accessioned2015-12-02T03:02:57Z-
dc.date.available2015-12-02T03:02:57Z-
dc.date.issued199105-
dc.identifier.citationv. 69, no. 10, 6979-6981-
dc.identifier.other2337-
dc.identifier.urihttp://pubs.kist.re.kr/handle/201004/8494-
dc.publisherJournal of applied physics-
dc.subjectelectron deep trap-
dc.subjectgeneration lifetime-
dc.subjectCz-Si-
dc.titleEffects of electron deep traps on generation lifetime in denuded zone n-type(III) Cz-Si wafer.-
dc.typeArticle-
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