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dc.contributor.authorKim, Yong Tae-
dc.date.accessioned2024-01-12T11:11:53Z-
dc.date.available2024-01-12T11:11:53Z-
dc.date.created2022-01-14-
dc.date.issued1997-07-01-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/85510-
dc.titleC-V characteristics of Pt/SrBi2Ta2O9/CeO2/Si structure for non volatile memory devices-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitationEuropean Solid State Device Research Conference, pp.756 - 759-
dc.citation.titleEuropean Solid State Device Research Conference-
dc.citation.startPage756-
dc.citation.endPage759-
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