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The electrical characterization of battery materials with EBIC (Electron beam induced current)/RCI (Resistive contrast image) analysis

Authors

Kim Ji-Young; Park. Jaeho; Chung, Kyung Yoon; Chun Dong Won

Publisher

9.9~14, 시드니, 오스트레일리아

Citation

19th International Microscopy Congress (IMC19)

URI

https://pubs.kist.re.kr/handle/201004/86702

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KIST Conference Paper > Others

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