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dc.contributor.authorKim Seong Kwang-
dc.contributor.authorShim Jae Phil-
dc.contributor.authorGeum Daemyeong-
dc.contributor.author김재원-
dc.contributor.author김창주-
dc.contributor.authorKIM HANSUNG-
dc.contributor.authorSONG, JIN-DONG-
dc.contributor.author최성진-
dc.contributor.author김대환-
dc.contributor.authorChoi, Won Jun-
dc.contributor.authorKim Hyung-jun-
dc.contributor.author김동명-
dc.contributor.authorSanghyeon Kim-
dc.date.accessioned2024-01-12T12:41:31Z-
dc.date.available2024-01-12T12:41:31Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/87183-
dc.languageEnglish-
dc.publisher2.7 강원 하이원리조트-
dc.titleImpact of Ground Plane Doping on InGaAs-OI MOSFETs-
dc.typeConference-
dc.description.journalClass2-
dc.identifier.bibliographicCitation한국반도체학술대회-
dc.citation.title한국반도체학술대회-
dc.citation.conferencePlaceKO-
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