Charge trapping instabilities in SiO2/InP MIS structures.

Title
Charge trapping instabilities in SiO2/InP MIS structures.
Authors
강광남이정일최병두김충환임한조한일기
Keywords
InP MIS structures
Issue Date
1992-01
Publisher
한국 물리학회 학술발표회 , 국방과학 연구소
Citation
, ?-?
URI
http://pubs.kist.re.kr/handle/201004/8885
Appears in Collections:
KIST Publication > Conference Paper
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