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CSEOF의 멀티 기준을 이용한 세분화된 입자 생성 및 성장 현상 판독 방법

Author

김유미; 김광열; 김상우; 김진영

Assignee

한국과학기술연구원

Regitration Date

2016-08-16

Registration No.

10-1649993

Application Date

2014-12-12

Application No.

2014-0179593

Country

KO

URI

https://pubs.kist.re.kr/handle/201004/89244

Appears in Collections:

KIST Patent > 2014

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