Full metadata record

DC Field Value Language
dc.contributor.author김재헌-
dc.contributor.author오주영-
dc.contributor.author김대유-
dc.contributor.author이경민-
dc.contributor.author김석환-
dc.date.accessioned2024-01-12T17:01:10Z-
dc.date.available2024-01-12T17:01:10Z-
dc.date.issued2019-09-20-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/91920-
dc.title객관적 시야 검사를 위한 망막 신경절 세포 밀도 지도-
dc.typePatent-
dc.date.registration2019-09-20-
dc.date.application2017-11-29-
dc.identifier.patentRegistrationNumber10-2025769-
dc.identifier.patentApplicationNumber2017-0161981-
dc.publisher.countryKO-
dc.type.iprs특허-
dc.contributor.assignee한국과학기술연구원-
Appears in Collections:
KIST Patent > 2017
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE