Surface Analysis of Diblock Copolymer Films by TOF-SIMS in Combination with AFM

Authors
Lee Ji-hye김선희강희경LEE, KANG BONGLEE, YEON HEE
Citation
International Conference on Secondary Ion Mass Spectrometry
URI
https://pubs.kist.re.kr/handle/201004/93279
Appears in Collections:
KIST Conference Paper > Others
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