Near edge X-ray absorption fine structure study of Zn0.8Mg0.2O thin films

Authors
Ankush VijAmanpal SinghRavi KumarSanjeev GautamDinesh KumarCHAE, KEUN HWA
Citation
AIP conference proceedings, v.1536, pp.721 - 722
Keywords
Sol-gel; X-ray diffraction; X-ray absorption spectroscopy
URI
https://pubs.kist.re.kr/handle/201004/93875
Appears in Collections:
KIST Conference Paper > Others
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE