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Development of aptamer sensor by using total internal reflection ellipsometry

Authors

Jung Yong Woo; Lee, Seok; Woo, Deok Ha; KIM, JAE HUN

Citation

제19회 광전자 및 광통신 학술회의 논문, pp.290 - 291

Keywords

aptamer; ellipsometry

URI

https://pubs.kist.re.kr/handle/201004/95787

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KIST Conference Paper > Others

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