The shift of threshold voltage and subthreshold current curve in LDD MOSFET degraded under difference DC stress-biases.

Title
The shift of threshold voltage and subthreshold current curve in LDD MOSFET degraded under difference DC stress-biases.
Authors
강광남이명복이정일
Keywords
MOSFET
Issue Date
1989-01
Publisher
전자공학회논문지
Citation
v. 26, no. 5, 682-?
URI
http://pubs.kist.re.kr/handle/201004/9747
Appears in Collections:
KIST Publication > Article
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