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dc.contributor.author강광남-
dc.contributor.author이명복-
dc.contributor.author이정일-
dc.date.accessioned2015-12-02T04:50:25Z-
dc.date.available2015-12-02T04:50:25Z-
dc.date.issued198901-
dc.identifier.citationv. 26, no. 5, 682-?-
dc.identifier.other1291-
dc.identifier.urihttp://pubs.kist.re.kr/handle/201004/9747-
dc.publisher전자공학회논문지-
dc.subjectMOSFET-
dc.titleThe shift of threshold voltage and subthreshold current curve in LDD MOSFET degraded under difference DC stress-biases.-
dc.typeArticle-
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