DSpace at KISTKIST Conference PaperOthers

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dc.contributor.authorKim, Bo Seul-
dc.contributor.authorKim Do Hyung-
dc.contributor.authorYou Dongyoun-
dc.contributor.authorLee Sang Yeol-
dc.date.accessioned2024-01-12T22:04:48Z-
dc.date.available2024-01-12T22:04:48Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/97821-
dc.languageEnglish-
dc.titleEffects of post-annealing temperature on electrical performances in amorphous SiInZnO thin film transistor-
dc.typeConference-
dc.description.journalClass2-
dc.identifier.bibliographicCitation한국전기전자재료학회-
dc.citation.title한국전기전자재료학회-
dc.citation.conferencePlaceKO-
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