Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Bo Seul | - |
| dc.contributor.author | Kim Do Hyung | - |
| dc.contributor.author | Lee Sang Yeol | - |
| dc.date.accessioned | 2024-01-12T22:06:42Z | - |
| dc.date.available | 2024-01-12T22:06:42Z | - |
| dc.date.created | 2021-09-29 | - |
| dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/97959 | - |
| dc.language | English | - |
| dc.title | Change of interfacial properties and trap density in amorphous InGaZnO thin film transistor depending on different rf power of sputtering | - |
| dc.type | Conference | - |
| dc.description.journalClass | 1 | - |
| dc.identifier.bibliographicCitation | 7th International Symposium on Transparent Oxide Thin Films for Electronics and Optics | - |
| dc.citation.title | 7th International Symposium on Transparent Oxide Thin Films for Electronics and Optics | - |
| dc.citation.conferencePlace | JA | - |
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