KIST Library Institutional Repository

A Quantitative Analysis for CIGS Thin Films by Dynamic Secondary Ion Mass Spectrometry

Authors

LIM, WEON CHEOL; Lee Ji-hye; Won, Sung Ok; LEE, YEON HEE

Citation

107th 춘계대한화학회

Keywords

Quantitative; CIGS; SIMS; XRF

URI

https://pubs.kist.re.kr/handle/201004/97995

Appears in Collections:

KIST Conference Paper > Others

Files in This Item:

There are no files associated with this item.

Export

RIS (EndNote)

XLS (Excel)

XML