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dc.contributor.authorLee Sang Yeol-
dc.contributor.authorChong Eu Gene-
dc.contributor.authorKim Seung Han-
dc.contributor.authorChun Yoon Soo-
dc.date.accessioned2024-01-12T22:36:07Z-
dc.date.available2024-01-12T22:36:07Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/98468-
dc.languageEnglish-
dc.titleComprehensive study on the bias and temperature induced instability of ZnO based thin film transistors-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitationChangchun 2010-
dc.citation.titleChangchun 2010-
dc.citation.conferencePlaceCC-
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