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dc.contributor.authorLee, Byung Chul-
dc.contributor.authorKang Chan Min-
dc.contributor.authorKim jin sik-
dc.contributor.authorKang, Ji Yoon-
dc.contributor.authorShin, Hyun Joon-
dc.contributor.authorLee Sang Youp-
dc.date.accessioned2024-01-12T23:05:50Z-
dc.date.available2024-01-12T23:05:50Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/99027-
dc.languageEnglish-
dc.titleELECTRICALLY TETHERED DNA STRETCHING IN NANOCHANNELS-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitationASME International Mechanical Engineering Congress and Exposition-
dc.citation.titleASME International Mechanical Engineering Congress and Exposition-
dc.citation.conferencePlaceUS-
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