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dc.contributor.author김긍호-
dc.contributor.author우현정-
dc.contributor.author최두진-
dc.date.accessioned2015-12-02T04:51:18Z-
dc.date.available2015-12-02T04:51:18Z-
dc.date.issued199501-
dc.identifier.citationv. 25, no. 2, 73-79-
dc.identifier.other4379-
dc.identifier.urihttp://pubs.kist.re.kr/handle/201004/9907-
dc.publisher한국전자현미경학회지-
dc.publisherKorean journal of electron microscopy-
dc.subjectlattice strain-
dc.titleMeasurements of lattice strain in SiO//2Si interface using convergent beam electron diffraction.-
dc.typeArticle-
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