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A comparison of quantitative analysis for various matrix containing Fe/Ni by depth profiling of dynamic SIMS

Authors

LIM, WEON CHEOL; Lee Ji-hye; LEE, YEON HEE

Citation

대한화학회 학술발표회(춘계)

Keywords

quantitative; depth profiling; dynamic SIMS; thin layer; Fe/Ni

URI

https://pubs.kist.re.kr/handle/201004/99512

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KIST Conference Paper > Others

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