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SIMS Depth profiling of PS-PPrMA diblock coplymers

Authors

Lee Ji-hye; K. Kim; LEE, YEON HEE

Citation

239th ACS National Meeting & Exposion, v.239, pp.69

Keywords

PS-PPrMA; Block coplymer; SIMS; Depth profiling

URI

https://pubs.kist.re.kr/handle/201004/99559

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KIST Conference Paper > Others

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