Degradation characteristics of Si-tip field emission device

Title
Degradation characteristics of Si-tip field emission device
Authors
이상조주병권오명환박종원박공석이경상김원현윤광호전동렬
Keywords
cold cathode; FEA; aging test
Issue Date
1997-01
Publisher
제 1 회 한국 정보디스플레이 학술대회 논문집 , KIST
Citation
, 143-144
URI
http://pubs.kist.re.kr/handle/201004/9988
Appears in Collections:
KIST Publication > Conference Paper
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