Showing results 6 to 7 of 7
Issue Date | Title | Author(s) |
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- | Surface instability caused by stress during chemical etching of silicon wafer | HAN, JUN HYUN; Kim Jae Hyun; Myoung-Woon Moon; HAN, SEUNG HEE; Joost J. Vlassak |
- | Thin capillary electrophoresis chips for fluorescence detection | Yang, Eun Gyeong; Kim Jae Hyun; SHIN KYEONG SIK; Kim Sang Kyung; Kang, Ji Yoon; Kim, Tae Song |