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Showing results 1 to 5 of 5

Issue DateTitleAuthor(s)
2011-05A Single Element Phase Change MemoryLee, Sang-Hyeon; Kim, Moonkyung; Cheong, Byung-ki; Kim, Jooyeon; Lee, Jo-Won; Tiwari, Sandip
-Comparison of thermal property between Ge2Sb2Te5 and In3Sb1Te2 alloys for phase-change memoryKim, Yong Tae; Yong In Kim; Jeong Yong
-Fast-Fourier Transform method to identify the high resolution transmission electron microscopy images of GST thin filmsKim, Yong Tae; Park Yu Jin; Jeong Yong Lee
-Surface energy and equilibrium shape of hexagonal structured Ge2Sb2Te5 grainKim, Yong Tae; Park Yu Jin; Youm Min Soo; Akihiro Wakahara
-The Effect of Ge Addition on the Operation Characteristics of a Phase-change Memory(PCM) Device Using Ge-doped SbTePark Young-wook; Lee Hyun Seok; Hyung-Woo Ahn; Wu Zhe; Lee Suyoun; Jeung-hyun Jeong; Jeong, Doo Seok; Kyung-woo Yi; CHEONG, BYUNG KI
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