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Showing results 1 to 5 of 5

Issue DateTitleAuthor(s)
-Characteristics of the crystal structure and electrical properties of Pt/SrBi2Ta2O9/ZrO2/Si structure최훈상; 김은홍; Kim Yong Tae; 최인훈
2000-02-21Comparison of memory effect between YMnO3 and SrBi2Ta2O9 ferroelectric thin films deposited on Si substratesLee, HN; Kim, YT; Choh, SH
-EL-MoM2 effects of Ta2O5 and Al2O3 buffer insulators on electrical characteristics of Pt/SrBi2Ta2O9/Si gate structure최훈상; Kim Yong Tae; M. Ischida; 최인훈; 이창우
-EL-MoM5 effects of Bi/Sr stoichiometric ratio on electrical properties of Pt/SrBi2Nb2O9/Si ferroelectric gate structureKim Yong Tae; Kim Seong Il; 최인훈; 최훈상; 이창우
-Electrical properties of Pt/SrBi2Ta2O9/Ta2O5/Si ferroelectric gate structure최훈상; Kim Yong Tae; Kim Seong Il; 최인훈; Hoon Sang Choi; Seong Il Kim; In-Hoon Choi
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