Showing results 1 to 4 of 4
Issue Date | Title | Author(s) |
---|---|---|
2020-01-01 | Channel thickness-dependent mobility degradation in planar junctionless transistors | Jeon, Dae-Young |
2023-02 | Junctionless Electric-Double-Layer MoS2 Field-Effect Transistor with a Sub-5 nm Thick Electrostatically Highly Doped Channel | 전대영; 박지민; Park, So Jeong; Kim, Gyu-Tae |
- | Series resistance characterization of junctionless transistors | Dae-Young Jeon; S. J. Park; M. Mouis; S. Barraud; G. -T. Kim; G. Ghibaudo |
2020-09-01 | Simple estimation of intrinsic electrical parameters in junctionless transistors | Jeon, Dae-Young |