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Showing results 10 to 17 of 17

Issue DateTitleAuthor(s)
-Relationship between the shape of KOH-etched bonding interface and the interfacial oxide condition in silicon direct bondingJu Byeong Kwon; 차균현; OH MYUNG HWAN
1992-01Short consideration on the non-uniformities existing at the etched-edges in deep anisotropic etching of (100) silicon주병권; 하병주; 김철주; 오명환; 차균현
-Study on the batch fabrication of silicon diaphragms하병주; Ju Byeong Kwon; 차균현; OH MYUNG HWAN; 김철주
1994-04Study on the bonding interface in directly-bonded Si-Si and Si-SiO2/Si wafer pairs주병권; 방준호; 이윤희; 박종완; 차균현; 오명환
1996-12The low power SRAM design with charge recycling강용섬; 이주석; 박노경; 김형곤; 주병권; 차균현
1995-03직접접합된 실리콘 기판쌍에 있어서 계면 산화막의 상태와 이의 새로운 평가방법 .주병권; 이윤희; 정회환; 정관수; D. B. Murfett; M. R. Haskard; 차균현; 오명환
-(Undefined)Ju Byeong Kwon; OH MYUNG HWAN; KIM Hyoung Gon; 차균현
-(Undefined)Ju Byeong Kwon; OH MYUNG HWAN; 하병주; 차균현; 김철주

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