Showing results 3 to 5 of 5
Issue Date | Title | Author(s) |
---|---|---|
- | Less surface roughness scattering effects in highly doped Si-channel and ambipolar conduction behavior with Schottky-barrier contacts | Dae-Young Jeon; So Jeong Park; Gyu-Tae Kim; Gerard Ghibaudo; Sebastian Pregl; Thomas Mikolajick; Walter M. Weber |
2019-04 | Series Resistance Effects on the Back-gate Biased Operation of Junctionless Transistors | Dae-Young Jeon; So Jeong Park; Mireille Mouis; Sylvain Barraud; Gyu-Tae Kim; Gerard Ghibaudo |
2019-04 | Simple Method for Determining Channel Doping Concentration of Highly Doped FD-SOI Devices | So Jeong Park; Dae-Young Jeon; Gyu-Tae Kim |