| - | Asymmetric staggered electrode for oxide thin film transistors | Chong Eu Gene; Chun Yoon Soo; Jo Kyoungchul; Kim Seung Han; Lee Sang Yeol |
| - | Change of electrical properties of a-IGZO TFT depending on processing parameters | Jo Kyoungchul; Chong Eu Gene; J. S. Lee; Lee Sang Yeol |
| - | Comprehensive study on the bias and temperature induced instability of ZnO based thin film transistors | Lee Sang Yeol; Chong Eu Gene; Kim Seung Han; Chun Yoon Soo |
| - | Effect of magnesium oxide passivation on the performance of amorphous indium-gallium-zinc-oxide thin film transistor | You Dongyoun; Chong Eu Gene; Kim Do Hyung; Byeong Kwon ju; Lee Sang Yeol |
| - | Effect of magnesium oxide passivation on the performance of amorphous indium-gallium-zinc-oxide thin film transistors | You Dongyoun; Chong Eu Gene; Byeong-Kwon Ju; Lee Sang Yeol |
| - | Effects of electrode structures on the electrical properties of amorphous ZnO thin film transistor | Chun Yoon Soo; Chong Eu Gene; Jo Kyoungchul; Lee Sang Yeol |
| - | Efficient suppression of the anomalous behaviors in a-IGZO TFT with HfO2 sandwiched by Al2O3 layers | Jo Kyoungchul; Chong Eu Gene; Chun Yoon Soo; Byeong-Kwon Ju; Lee Sang Yeol |
| - | Electrical properties of amorphous hafnium-indium-zinc-oxide thin film transistors with highly conductive buried layer | Chong Eu Gene; Lee Sang Yeol |
| - | High Performance of Thin Film Transistor using Novel Dual Electrode Structure | Jo Kyoungchul; Chong Eu Gene; Chun Yoon Soo; Lee Sang Yeol |
| - | High stability of Hf-In-Zn-O thin film transistor | Chong Eu Gene; Lee Sang Yeol |
| - | Improvement of bias stability of indium zinc oxide TFTs by the incorporation of hafnium fabricated by radio-frequency magnetron sputtering | Chong Eu Gene; Jo Kyoungchul; Kim Seung Han; Chun Yoon Soo; Lee Sang Yeol |
| - | Instability induced by air in amorphous Zn-Sn-O (ZTO) thin film transistor | Kim Seung Han; Chun Yoon Soo; Chong Eu Gene; Jo Kyoungchul; Chang-Il Kim; Lee Sang Yeol |
| - | Low channel resistance in amorphous oxide thin-film transistors with buried layer | Chong Eu Gene; Lee Sang Yeol |
| - | Nitrogen doping effect on long-term stability of zinc oxide TFTs using DBD-PLD system | Chun Yoon Soo; Chong Eu Gene; Jung Da Woon; Lee Sang Yeol |
| - | Novel dual electrode structure for thin film transistor to enhance the performance of the TFT | Jo Kyoungchul; Chong Eu Gene; Chun Yoon Soo; Byeong-Kwon Ju; Lee Sang Yeol |
| - | Relation between processing parameters and performance of novel amorphous silicon-indium-zinc oxide thin film transistors | Chong Eu Gene; Kim Seung Han; Gun-Eik Jang; Lee Sang Yeol |
| - | Role of Hf in amorphous oxide thin film transistors fabricated by rf-magnetron sputtering | Chong Eu Gene; Chun Yoon Soo; Jo Kyoungchul; Kim Seung Han; Jung Da Woon; Lee Sang Yeol |
| - | Stability enhancement of amorphous zinc oxide thin film transistors fabricated by pulsed laser deposition with DBD | Chun Yoon Soo; Chong Eu Gene; Jo Kyoungchul; Kim Seung Han; Jung Da Woon; Lee Sang Yeol |
| - | Temperature Induced Instability of Passivation-Free Amorphous Indium Zinc Oxide (a-IZO) Thin Film Transistor | Chong Eu Gene; Chun Yoon Soo; Jo Kyoungchul; Kim Seung Han; Jung Da Woon; Lee Sang Yeol |
| - | The characteristics changing of HfInZnO TFT with process conditions by RF sputter | Jung Da Woon; Chong Eu Gene; Kim Seung Han; Chun Yoon Soo; Lee Sang Yeol |
| - | ZnO-based thin film transistors with low annealing temperature | Chong Eu Gene; Lee Sang Yeol |
| - | (Undefined) | Chun Yoon Soo; Chong Eu Gene; Jo Kyoungchul; Lee Sang Yeol |
