Browsing byAuthorLee Ji-hye

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Showing results 1 to 30 of 42

Issue DateTitleAuthor(s)
-A comparison of quantitative analysis for various matrix containing Fe/Ni by depth profiling of dynamic SIMSLIM, WEON CHEOL; Lee Ji-hye; LEE, YEON HEE
-A Quantitative Analysis for CIGS Thin Films by Dynamic Secondary Ion Mass SpectrometryLIM, WEON CHEOL; Lee Ji-hye; Won, Sung Ok; LEE, YEON HEE
-A Study of Dynamic SIMS analysis of Cu(In Ga)Se2 (CIGS)LIM, WEON CHEOL; Lee Ji-hye; LEE, YEON HEE
-Analysis of Natural Dyes in Archaeological Textiles using TOF-SIMS and other Analytical TechniquesLee Ji-hye; Kim,Man-Ho; LEE, KANG BONG; Elsa van Elslande; Philippe Walter; LEE, YEON HEE
-Applications of surface analytical techniques for organic materials in archaeology or forensic scienceLEE, YEON HEE; Lee Ji-hye; S. Ham; LEE, KANG BONG
-Applications of TOF-SIMS for organic materials in archaeology and forensic sicenceLEE, YEON HEE; Lee Ji-hye; Youngsoo, Kim; Seokchan Choi; Seung Wook Ham; LEE, KANG BONG; Chiwoo Lee; Kang-Jin Kim
-Characterization and Sequence Determination of Ball-point Pen Inks and Red Sealing-inks by TOF-SIMS and ATR FT-IRLee Ji-hye; Cho Youn Jeong; NAM, YUN SIK; LEE, KANG BONG; LEE, YEON HEE
-Characterization of Cu(InGa)Se2 (CIGS) Thin Films in Solar Cell Devices by Secondary Ion Mass SpectrometryLIM, WEON CHEOL; Lee Ji-hye; Won, Sung Ok; LEE, YEON HEE
-Characterization of Cu(InGa)Se2 (CIGS) thin films in solar cell devices by secondary ion mass spectrometryLIM, WEON CHEOL; Lee Ji-hye; LEE, YEON HEE
-Characterization of dyed textiles using TOF-SIMS with PCALee Ji-hye; A. Ceglia; 김강진; LEE, YEON HEE
-Characterization of fluorocarbon fhin films deposited by ICP and PPLee Ji-hye; K. Kim; LEE, YEON HEE
-Characterization of microphase-separated diblock copolymer films by TOF-SIMSLee Ji-hye; Min Hwa Kang; LIM, WEON CHEOL; Kwanwoo Shin; LEE, YEON HEE
-Characterization of Nanostructures in Blend and Copolymer films depend on Annealing ConditionKang Minhwa; Lee Ji-hye; LEE, YEON HEE
-Chemical composition and lead isotope ratio analysis for iron armor by SIMSLee Ji-hye; LEE, YEON HEE; K. Kim
-Comparision of conventional lacquer and cashew coatings by TOF-SIMS and XPSLee Ji-hye; LEE, YEON HEE; 함승욱; 김규호; 김강진
-Comparison of Quantitative Analysis for Photocoltaic CIGS Thin Films by SIMS Depth Profiling with Element Ions and MCs+ ClustersLEE, YEON HEE; Lee Ji-hye; 김선희; Jang Yun Jung
-Compositional Analysis of Cu(In,Ga)Se2 Thin Films using Various Analytical TechniquesLee Ji-hye; LEE, YEON HEE
-Depth profiling of lamella phase block copolymer using SIMSLEE, YEON HEE; Lee Ji-hye; Donghwan Yoon; Kwanwoo Shin
-Identification of Natural Dyes on Ag Nanoparticles by Surface-Enhanced Raman ScatteringLee Ji-hye; Kim Min Jung; Philippe Walter; LEE, YEON HEE
-Identification of sequence between overlapping signatures of different pen inks by TOF-SIMS imaging김선희; Lee Ji-hye; LIM, WEON CHEOL; LEE, YEON HEE
-Investigation for Nano-structured Blend Homopolymers and Diblock Copolymers by AFM and TOF-SIMSKang Minhwa; Lee Ji-hye; jimijung; LEE, YEON HEE
-Investigation of Microphase Separation of PS-PPrMA Diblock Copolymer Films by Time-of-Flight Secondary Ion Mass SpectrometryLEE, YEON HEE; Lee Ji-hye; LIM, WEON CHEOL; 신관우
-Investigation of natural dyes and ancient textiles from Korea using TOF-SIMSLEE, YEON HEE; Lee Ji-hye; Youngsoo, Kim; Kang-Jin Kim; Seungwook Ham
-Qualitative analysis of the red stamping inks in the document using TOF-SIMSCho Youn Jeang; Lee Ji-hye; 윤정현; LEE, YEON HEE
-Qualitative analysis of the red stamping inks on paper using TOF-SIMSLee Ji-hye; Chiwoo Lee; LEE, YEON HEE
-Quantitative Analysis of Metal Alloy by TOF-SIMS Depth ProfilingLIM, WEON CHEOL; Lee Ji-hye; LEE, YEON HEE
-Quantitative surface analysis of binary alloy thin films by depth profiling of TOF-SIMS and Dynamic SIMSLIM, WEON CHEOL; Lee Ji-hye; LEE, YEON HEE
-Sequence relation and qualitative analysis of various inks using TOF-SIMSLee Ji-hye; LEE, YEON HEE; 김강진
-SIMS Depth profiling of PS-PPrMA diblock coplymersLee Ji-hye; K. Kim; LEE, YEON HEE
-Surface Analysis and Depth Profiling of Polymers by TOF-SIMSLEE, YEON HEE; Lee Ji-hye; 김선희; Kang Minhwa

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