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Issue DateTitleAuthor(s)
2024-01Defect-Engineered Semiconducting van der Waals Thin Film at Metal-Semiconductor Interface of Field-Effect TransistorsKim, Jihyun; Rhee, Dongjoon; Jung, Myeongjin; Cheon, Gang Jin; Kim, Kangsan; Kim, Jae Hyung; Park, Ji Yun; Yoon, Jiyong; Lim, Dong Un; Cho, Jeong Ho; Kim, In Soo; Son, Donghee; Jariwala, Deep; Kang, Joohoon
1

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