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Showing results 1 to 4 of 4

Issue DateTitleAuthor(s)
-Electronic Structure Studies of BiMn2-xTixO5 (x ≤ 0.5) using x-ray absorption spectroscopyD. K. Shukla; Ravi Kumar; S. Mollah; P. Thakur; CHAE, KEUN HWA; CHOI, WON-KOOK; A. Banerjee
-Electronic Structure Studies of PrFe1-xNixO3 (x ≤ 0.5) using X-ray Absorption SpectroscopyRavi Kumar; D. K. Shukla; S. Mollah; P. Thakur; CHAE, KEUN HWA; CHOI, WON-KOOK; Abida Bashir; M. Ikram
-Near edge X-ray absorption fine structure study of Zn0.8Mg0.2O thin filmsAnkush Vij; Amanpal Singh; Ravi Kumar; Sanjeev Gautam; Dinesh Kumar; CHAE, KEUN HWA
-X-ray Magnetic Circular Dichroism characterization of Co doped ZnO thin filmsP. Thakur; CHAE, KEUN HWA; Basavaraj Angadi; CHOI, WON-KOOK; A. P. Singh; Ravi Kumar
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