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Showing results 1 to 3 of 3

Issue DateTitleAuthor(s)
1994-01Comparison of high temperature thermal stability of Ru and RuO//2 schottky contact to GaAs.Kim Yong Tae; S. K. Kwak; C. W. Lee; J. G. Lee; C. S. Kwon; K. S. Jung; Min Suk-Ki
1995-01New concept for amorphous diffusion barrier: Ion beam modification of metal/semiconductor interface.Kim Yong Tae; S. K. Kwak; C. S. Kwon; D. J. Kim; C. W. Lee; I. H. Choi; Min Suk-Ki
-Study on physical properties of Cu-CVD for ULSI interconnects.Kim Yong Tae; Y. S. Kim; S. K. Kwak; C. S. Kwon; D. G. Jung; Min Suk-Ki
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