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Browsing byAuthorSylvain Barraud

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Issue DateTitleAuthor(s)
2019-04Series Resistance Effects on the Back-gate Biased Operation of Junctionless TransistorsDae-Young Jeon; So Jeong Park; Mireille Mouis; Sylvain Barraud; Gyu-Tae Kim; Gerard Ghibaudo
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